Proceedings of the 9th Workshop of the European Microbeam Analysis Society (EMAS) and the 3rd Meeting of the International Union of Microbeam Analysis Societies (IUMAS)
1-3
Editorial
Modern Developments and Applications in Microbeam Analysis. Proceedings of the 9th Workshop of the European Microbeam Analysis Society (EMAS) and the 3rd Meeting of the International Union of Microbeam Analysis Societies (IUMAS), Florence, Italy, May 22–26, 2005
Romano Rinaldi, Aldo Armigliato, Alba P. Santo, Gloria Vaggelli and Clive T. Walker, et al.
5-10
Original Paper
Imaging Single Atoms with Z-Contrast Scanning Transmission Electron Microscopy in Two and Three Dimensions
Paul M. Voyles
11-17
Original Paper
Atomic Level Characterization Based on Focus Modulation Electron Microscopy
Yoshizo Takai, Masaki Taya, Hidekazu Chikada and Yoshihide Kimura
19-29
Original Paper
Orientation Imaging Microscopy for the Transmission Electron Microscope
David J. Dingley
31-37
Original Paper
Advances in Electron Backscatter Diffraction for the Characterisation of Interfaces
Valerie Randle
39-44
Original Paper
Imaging and Microanalysis in Environmental Scanning Electron Microscopy
Bradley L. Thiel
45-50
Original Paper
ESEM Applications: From Cultural Heritage Conservation to Nano-Behaviour
Eric Doehne
51-58
Original Paper
Cathodoluminescence Microscopy and Spectroscopy of Opto-Electronic Materials
Matthew R. Phillips
59-66
Original Paper
Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors
Ken Moran and Richard Wuhrer
67-74
Original Paper
Monte Carlo Simulation in Electron Probe Microanalysis. Comparison of Different Simulation Algorithms
Francesc Salvat, Xavier Llovet, José M. Fernández-Varea and Josep Sempau
75-81
Original Paper
Quantitative X-Ray Microanalysis of Heterogeneous Materials Using Monte Carlo Simulations
Raynald Gauvin
83-86
Original Paper
Electron Excited L X-Ray Spectra of the Elements 14 ≤ Z ≤ 22
Andrea Aßmann, Jan Dellith and Michael Wendt
87-89
Original Paper
Electron Excited L X-Ray Spectra of the Elements 24 ≤ Z ≤ 33
Andrea Aßmann, Jan Dellith and Michael Wendt
91-94
Original Paper
Microanalysis of Hydrogen, Boron and Fluorine in Vesuvianite by Means of SIMS, EPMA and FTIR
Fabio Bellatreccia, Luisa Ottolini and Giancarlo Della Ventura
95-100
Original Paper
Assessment of Inorganic Fibre Burden in Biological Samples by Scanning Electron Microscopy – Energy Dispersive Spectroscopy
Elena Belluso, Donata Bellis, Elisa Fornero, Silvana Capella and Giovanni Ferraris, et al.
101-104
Original Paper
Laboratory Microbeam Analysis Applied to Cultural Heritage Studies
Dario Benedetti, Ivano Alessandri, Paolo Bergese, Elza Bontempi and Paolo Colombi, et al.
105-112
Original Paper
Yttrium Geothermometry Applied to Garnets from Different Metamorphic Grades Analysed by EPMA and µ-PIXE Techniques
Alessandro Borghi, Roberto Compagnoni, Roberto Cossio, Lorenzo Giuntini and Mirko Massi, et al.
113-120
Original Paper
Installation of a Shielded SIMS for the Analysis of Irradiated Nuclear Fuels
Stéphane Brémier, Rachid Hasnaoui, Stéphane Portier, Olivier Bildstein and Clive T. Walker
121-124
Original Paper
The Blue Pigment Used in Vallemaggia (Switzerland) in the Half of 19th Century by Painters Vanoni and Pedrazzi
Giovanni Cavallo
125-128
Original Paper
Accurate Determination of Trace Amounts of Oxygen in CrAlN Hard Coatings by a Combination of WDS–EPMA and SIMS
Sabine Dreer, Peter Wilhartitz, Bernhard Sartory, Richard Tessadri and Kurt Piplits, et al.
129-136
Original Paper
EDX-Spectra Simulation in Electron Probe Microanalysis. Optimization of Excitation Conditions and Detection Limits
Frank Eggert
137-140
Original Paper
WDXRF, EPMA and SEM/EDX Quantitative Chemical Analyses of Small Glass Samples
Roberto Falcone, Giuseppe Sommariva and Marco Verità
141-145
Original Paper
The Valence State Analysis of Ti in FeTiO3 by Soft X-Ray Spectroscopy
Sei Fukushima, Takashi Kimura, Kenji Nishida, Vlaicu A. Mihai and Hideki Yoshikawa, et al.
147-150
Original Paper
Microanalysis of Glass Surfaces after Thermal Exposure
Ondrej Gedeon and Karel Jurek
151-155
Original Paper
Advanced X-Ray Laboratory Microbeam Techniques Applied to Metallurgy
Marcello Gelfi, Elza Bontempi, Giovanna Cornacchia, Roberto Roberti and Laura E. Depero
157-161
Original Paper
Low Voltage Contrast with an SEM Transmission Electron Detector
François Grillon
163-167
Original Paper
Van Gogh’s Painting Grounds: Quantitative Determination of Bulking Agents (Extenders) Using SEM/EDX
Ralph Haswell, Leslie Carlyle and Kees T. J. Mensch
169-174
Original Paper
Micro Analysis on Hallstatt Textiles: Colour and Condition
Ineke Joosten, Maarten R. van Bommel, Regina Hofmann-de Keijzer and Hans Reschreiter
175-178
Original Paper
Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun
Takashi Kimura, Kenji Nishida and Shigeo Tanuma
179-182
Original Paper
EPMA Investigation of Roman Coin Silvering Techniques
Gunther Kraft, Stefan Flege, Fritz Reiff, Hugo M. Ortner and Wolfgang Ensinger
183-187
Original Paper
Fission Gas Bubbles Characterisation in Irradiated UO2 Fuel by SEM, EPMA and SIMS
Jérôme Lamontagne, Lionel Desgranges, Christophe Valot, Jean Noirot and Thierry Blay, et al.
189-194
Original Paper
Preparation of Reference Glasses for in-situ Analysis of Lithium and Boron
Brieuc Le Fevre and Luisa Ottolini
195-198
Original Paper
Electron Probe Microanalysis of HfO2 Thin Films on Conductive and Insulating Substrates
Marina Lulla, Jelena Asari, Jaan Aarik, Kaupo Kukli and Raul Rammula, et al.
199-204
Original Paper
Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer
Claude Merlet and Xavier Llovet
205-208
Original Paper
Influence of Second-Order Lines on the Quantitative Wavelength Dispersive Spectrometry Analysis at Low Accelerating Voltages
Valdek Mikli
209-217
Original Paper
X-Ray Mapping and Interpretation of Scatter Diagrams
Ken Moran and Richard Wuhrer
219-223
Original Paper
Shave-Off Depth Profiling for Nano-Devices
Masashi Nojima, Masayuki Toi, Ayaka Maekawa, Takeshi Yamamoto and Tetsuo Sakamoto, et al.
225-228
Original Paper
Direct Visualization of Electromagnetic Microfields by Superposition of Two Kinds of Electron Holograms
Akinori Ohshita, Masaaki Okuhara, Chiharu Matsuya, Koichi Hata and Kazuo Iida
229-233
Original Paper
Strategies for Quantification of Light Elements in Minerals by SIMS: H, B and F
Luisa Ottolini, Fernando Cámara and Frank C. Hawthorne
235-242
Original Paper
New Orientation Formation During Recrystallization of Cold Deformed, High Symmetry Aluminium Bicrystals
Henryk Paul and Julian Driver
243-250
Original Paper
Orientation Imaging in Scanning Electron and Transmission Electron Microscopy for Characterization of the Shear Banding Phenomenon
Henryk Paul, Adam Morawiec, Emmanuel Bouzy, Jean-Jacques Fundenberger and Andrzej Piątkowski
251-255
Original Paper
Light-Lithophile Element Metasomatism of Finero Peridotite (W ALPS): A Secondary-Ion Mass Spectrometry Study
Nicola Raffone, Brieuc Le Fèvre, Luisa Ottolini, Riccardo Vannucci and Alberto Zanetti
257-262
Original Paper
A New Method to Examine Interfacial Reactions of a Multilayered System NiAl–Hf–hBN on a Sapphire Fibre
Silvia Richter, Stepan Kyrsta, Jochen Schneider, David Hajas and Joachim Mayer
263-267
Original Paper
External Micro-PIXE Measurements: Preliminary Results on Volcanic Rocks from Nyiragongo Volcano
Alba P. Santo, Mariaelena Fedi, Lorenzo Giuntini, Pier Andrea Mandò and Mirko Massi, et al.
269-274
Original Paper
The L Spectrum of Fe and Fe3O4
Andy Scheffel, Andrea Aßmann, Jan Dellith and Michael Wendt
275-278
Original Paper
Detector Calibration and Measurement of Fundamental Parameters for X-Ray Spectrometry
Frank Scholze, Burkhard Beckhoff, Michael Kolbe, Michael Krumrey and Matthias Müller, et al.
279-284
Original Paper
Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)
Hartmuth Schroettner, Mario Schmied and Stefan Scherer
285-288
Original Paper
Electrically Cooled SiLi Detectors for Application in X-Ray Equipment
Alexander Sokolov, Alexander Pchelintsev, Alexander Loupilov and Vladimir Gostilo
289-294
Original Paper
Pile-Up Correction for Improved Accuracy and Speed of X-Ray Analysis
Peter J. Statham
295-300
Original Paper
A New Method of Surface Preparation for High Spatial Resolution EPMA/SEM with an Argon Ion Beam
Hideyuki Takahashi, Ayako Sato, Masaru Takakura, Norihisa Mori and Juergen Boerder, et al.
301-304
Original Paper
Co-Localization of Copper, Zinc and Lead with Calcium in Their Accumulation Sites in the Housefly’s Abdomen by Micro-PIXE
Grzegorz Tylko, Joanna Borowska, Zuzanna Banach, Elżbieta Pyza and Wojciech J. Przybyłowicz, et al.
305-311
Original Paper
Micro-PIXE Analysis of Monazite from the Dora Maira Massif, Western Italian Alps
Gloria Vaggelli, Alessandro Borghi, Roberto Cossio, Mariaelena Fedi and Lorenzo Giuntini, et al.
313-318
Original Paper
A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces
Thomas Walther, Aleksander Rečnik and Nina Daneu
319-322
Original Paper
In-Situ Investigation of Discolouration Processes Between Historic Oil Paint Pigments
Rachel White, Matthew R. Phillips, Paul Thomas and Richard Wuhrer
323-326
Original Paper
Off-Line Metrology on SEM Images Using Gray Scale Morphology
Elias N. Zois, Ioannis Raptis and Vassilis Anastassopoulos
327
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