Proceedings of the European Microbeam Analysis Society (EMAS) (Guest Editors: L. Van’t dack, R. Gijbels, C. T. Walker)
285-286
Editorial
Modern developments and applications in microbeam analysis. Proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6–10, 2007
Luc Van’t dack, Renaat Gijbels and Clive T. Walker
287-293
Review
Conventional wavelength dispersive spectroscopy versus parallel beam spectroscopy – a basic overview
Corrie van Hoek and Max Koolwijk
295-299
Review
Applications of microanalysis in the cultural heritage field
Ineke Joosten
301-305
Original Paper
Micro X-ray fluorescence as a potential technique to monitor in-situ air pollution
Elza Bontempi, Raffaella Bertuzzi, Enrica Ferretti, Marcello Zucca and Pietro Apostoli, et al.
307-312
Original Paper
A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland)
Nicola Raffone, Luisa Ottolini, Sonia Tonarini, Giovanni Gianelli and Gudmundur Ómar Fridleifsson
313-321
Original Paper
Combined cathodoluminescence spectroscopy, electron microprobe and laser ablation ICP mass spectrometry analysis: an attempt to correlate luminescence and chemical composition of monazite
Gloria Vaggelli, Roberto Cossio, Maurizio Petrelli and Piergiorgio Rossetti
323-327
Original Paper
Soluble fraction of stabilising elements in ferritic stainless steel
Juan F. Almagro, Xavier Llovet, M. Auxiliadora Heredia, Carmen Luna and Rafael Sánchez
329-336
Original Paper
SIMS analysis of chlorine in metasomatised upper-mantle rocks
Luisa P. Ottolini and Brieuc Le Fèvre
337-342
Original Paper
Improvements in trace element detection in energy dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems
Roberto Cossio, Gloria Vaggelli and Alessandro Borghi
343-348
Original Paper
Light elements microanalysis of steel/B4C melts for nuclear power plants accident studies
Sergio Sao Joao, Christian Duriez, Cristina Dominguez and Didier Jacquemain
349-353
Original Paper
Chemical and microstructural characterization of natural hydroxyapatite derived from pig bones
Anna Maria Janus, Marek Faryna, Krzysztof Haberko, Anna Rakowska and Tomasz Panz
355-362
Original Paper
Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques
Jérôme Lamontagne, Catherine Eysseric, Lionel Desgranges, Christophe Valot and Jean Noirot, et al.
363-369
Original Paper
Van Gogh’s painting grounds: an examination of barium sulphate extender using analytical electron microscopy – SEM/FIB/TEM/EDX
R. Haswell, U. Zeile and K. Mensch
371-375
Original Paper
Investigation of In
x
Ga1−
x
N layers by local methods
Yana V. Domracheva, Leonid A. Bakaleinikov, Ekaterina Yu. Flegontova, Valentin N. Jmerik and Tatiana B. Popova, et al.
377-380
Original Paper
Volume and composition surface changes in alkali silicate glass irradiated with electrons
Karel Jurek and Ondrej Gedeon
381-386
Original Paper
Combined SEM-EDX and μ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfaces
Roberto Falcone, Pietro Galinetto, Bruno Messiga, Elisabetta Negri and Maria P. Riccardi, et al.
387-397
Original Paper
Applications of focused ion beam SIMS in materials science
David S. McPhail, Richard J. Chater and Libing Li
399-404
Original Paper
New model ultra-soft X-ray spectrometer for microanalysis
Sei Fukushima, Takashi Kimura, Toshiya Ogiwara, Kazunori Tsukamoto and Toyohiko Tazawa, et al.
405-411
Original Paper
Application of EPMA and analytical TEM to brazed metal-supported catalytic converters
Silvia Richter, Hans Bode, Arbi Dimyati and Joachim Mayer
413-419
Original Paper
X-ray fluorescence as an additional analytical method for a scanning electron microscope
Mathias Procop and Vasile-Dan Hodoroaba
421-425
Original Paper
Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope
Miroslava Schaffer and Julian Wagner
427-432
Original Paper
Virtual standard for wavelength-dispersive electron-probe microanalysis
Claude Merlet, Xavier Llovet, Olivier Dugne, Stephan Brémier and Wouter Van Renterghem, et al.
433-437
Original Paper
Multilayers for light element electron probe microanalysis
Stephen J. B. Reed
439-443
Original Paper
Model-based quantification of EELS: is standardless quantification possible?
Jo Verbeeck and Giovanni Bertoni
445-450
Original Paper
Electron beam and Mössbauer techniques combined to optimise base metal partitioning in the furnace
Lesley Andrews, Chris P. Pistorius and Frans B. Waanders
451-454
Original Paper
Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysis
Toshiya Ogiwara, Takashi Kimura, Sei Fukushima, Kazunori Tsukamoto and Toyohiko Tazawa, et al.
455-458
Original Paper
First X-ray fluorescence excited Kossel diffraction in SEM
Enrico Langer, Michael Haschke and Siegfried Däbritz
459-463
Original Paper
Monte Carlo calculations in X-ray microanalysis of epitaxial layers
Tatiana B. Popova, Ekaterina Yu. Flegontova, Leonid A. Bakaleinikov and Mariya V. Zamoryanskaya
465-469
Original Paper
Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritage
Velichka Kontozova-Deutsch, Felix Deutsch, Ricardo H. M. Godoi, Zoya Spolnik and William Wei, et al.
471-473
Original Paper
About the N-series X-ray lines in the electron excited spectra of heavy elements
Andy Scheffel, Jan Dellith and Michael Wendt
475-478
Original Paper
The M emission spectra of the heavy rare earth elements 67 ≤ Z ≤ 71
Jan Dellith and Michael Wendt
479-483
Original Paper
Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel
Stéphane Portier, Stéphane Brémier, Rachid Hasnaoui, Olivier Bildstein and Clive T. Walker