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Volume 29 / 1997 - Volume 34 / 2002
As of Volume 35 (January 2003), this journal is published by Taylor & Francis. Click here
1113-1122
Modeling and analysis of dynamic robust design experiments
KWOK-LEUNG TSUI
1123-1134
The GLRT for statistical process control of autocorrelated processes
DANIEL W. APLEY and JIANJUN SHI
1135-1145
Optimal adjustment strategies for a process with run-to-run variation and 0–1 quality loss
PASQUALE SULLO and MARK VANDEVEN
1147-1156
An approximate kinetic theory for accelerated testing
M.J. LuVALLE
1157-1169
Long run and transient analysis of a double EWMA feedback controller
ENRIQUE DEL CASTILLO
1171-1180
Review and classification of reliability measures for multistate and continuum models
RUSSELL D. BRUNELLE and KAILASH C. KAPUR
1181-1190
Performance comparison between on-line sensors and control charts in manufacturing process monitoring
KWEI TANG, WILLIAM W. WILLIAMS, WUSHONG JWO and LINGUO GONG
1191-1194
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