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Volume 1 / 1990 - Volume 27 / 2011
359
Editorial Board
Editorial
Vishwani D. Agrawal
361-362
Test Technology Technical Council Newsletter
A. Ivanov
363
Editorial Introduction
Guest Editorial
Krishnendu Chakrabarty
365-383
On IEEE P1500's Standard for Embedded Core Test
Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa McLaurin and Mike Ricchetti, et al.
385-400
An Integrated Framework for the Design and Optimization of SOC Test Solutions
Erik Larsson and Zebo Peng
401-414
On Concurrent Test of Core-Based SOC Design
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee and Omer Samman, et al.
415-434
A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm
Sandeep Koranne
435-454
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
Erik Jan Marinissen
455-473
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
Mounir Benabdenbi, Walid Maroufi and Meryem Marzouki
475-485
An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch
Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury and Sudipta Bhawmik
487-501
Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores
Tomokazu Yoneda and Hideo Fujiwara
503-514
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abhijit Jas and Nur A. Touba
515-527
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Jin-Fu Li, Ruey-Shing Tzeng and Cheng-Wen Wu
529-538
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Li Chen, Xiaoliang Bai and Sujit Dey
539-554
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
Mehrdad Nourani and Amir Attarha
555-564
On-Chip Clock Faults' Detector
C. Metra, M. Favalli, S. Di Francescantonio and B. Riccò
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