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Volume 1 / 1990 - Volume 27 / 2011
5
Editorial Board
Editorial
Vishwani D. Agrawal
7-8
Test Technology Technical Council Newsletter
André Ivanov
9-10
List of Reviewers
11
Guest Editorial
Victor Champac and Ingrid Jansch Porto
13-20
The ΣΔ-BIST Method Applied to Analog Filters
L. Cassol, O. Betat, L. Carro and M. Lubaszewski
21-28
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard
Gladys Omayra Ducoudray-Acevedo and Jaime Ramírez-Angulo
29-36
Topological Considerations for the Diagnosability Conditions of Analogue Circuits Using a Pair of Conjugate Trees
Luis Hernández-Martínez and Arturo Sarmiento-Reyes
37-48
Multiple Scan Chain Design for Two-Pattern Testing
Ilia Polian and Bernd Becker
49-60
A Unified DFT Approach for BIST and External Test
M.-L. Flottes, C. Landrault and A. Petitqueux
61-72
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems
Fabian Vargas, Rubem D.R. Fagundes and Daniel Barros
73-82
Design Error Diagnosis with Re-Synthesis in Combinational Circuits
Raimund Ubar
83-90
Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied
R. Velazco, S. Rezgui and H. Ziade
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