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Volume 1 / 1990 - Volume 27 / 2011
Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
495
Editorial Board
Editorial
V.D. Agrawal
497-498
Test Technology Technical Council Newsletter
André Ivanov
499
Guest Editorial
Cecilia Metra and Matteo Sonza Reorda
501-510
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
M. Pflanz, K. Walther, C. Galke and H.T. Vierhaus
511-521
Error Correcting Strategy for High Speed and High Density Reliable Flash Memories
D. Rossi and C. Metra
523-535
An Architecture for Self-Healing Digital Systems
P.K. Lala and B. Kiran Kumar
537-548
On-Line Monitor Design of Finite-State Machines
Feng Gao and John P. Hayes
549-558
BIST-Based Delay-Fault Testing in FPGAs
Miron Abramovici and Charles E. Stroud
559-575
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments
R. Leveugle and K. Hadjiat
577-584
Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor
M. Rebaudengo, M. Sonza Reorda and M. Violante
585-595
A Statistical Sampler for a New On-Line Analog Test Method
Marcelo Negreiros, Luigi Carro and Altamiro A. Susin
597-603
A BICS for CMOS OpAmps by Monitoring the Supply Current Peak
J. Font, J. Ginard, R. Picos, E. Isern and J. Segura, et al.
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