You have Guest access.
Log In
Volume 1 / 1990 - Volume 27 / 2011
607
Editorial Board
Editorial
Vishwani D. Agrawal
609-610
Test Technology Technical Council Newsletter
A. Ivanov
611-623
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids
Chintan Patel, Ernesto Staroswiecki, Smita Pawar, Dhruva Acharyya and Jim Plusquellic
625-635
On Faster IDDQ Measurements
C. Thibeault
637-644
A Low Power Pseudo-Random BIST Technique
Nadir Z. Basturkmen, Sudhakar M. Reddy and Irith Pomeranz
645-657
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients
Janusz Rajski and Jerzy Tyszer
659-670
Other Index
2003 Annual Index
Frequently asked questions General info on journals and books Send us your feedback Impressum Contact us
© Springer, Part of Springer Science+Business Media Privacy, Disclaimer, Terms & Conditions, and Copyright Info