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Volume 1 / 1990 - Volume 27 / 2011
On-line Testing
Guest Editors: Cecilia Metra and Matteo Reorda
459
Editorial Introduction
Editorial
Vishwani D. Agrawal
461-462
Test Technology Technical Council Newsletter
P. Prinetto
463
Guest Editorial
Cecilia Metra and Matteo Sonza Reorda
465-477
Design of Embedded Self-Testing Checkers for t-UED and BUED Codes
Steffen Tarnick
479-488
An Analog Checker with Input-Relative Tolerance for Duplicate Signals
Haralampos-G. D. Stratigopoulos and Yiorgos Makris
489-499
Efficient Realization of Parity Prediction Functions in FPGAs
Seok-Bum Ko and Jien-Chung Lo
501-509
Model for Transient Fault Susceptibility of Combinational Circuits
Martin Omaña, Daniele Rossi and Cecilia Metra
511-521
A New Approach to the Analysis of Single Event Transients in VLSI Circuits
M. Sonza Reorda and M. Violante
523-531
A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs
S. Matakias, Y. Tsiatouhas, A. Arapoyanni and Th. Haniotakis
533-542
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors
André K. Nieuwland and Richard P. Kleihorst
543-552
A Two-Level Power-Grid Model for Transient Current Testing Evaluation
B. Alorda, V. Canals and J. Segura
553-567
Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring Features
Amir Rajabzadeh, Seyed Ghassem Miremadi and Mirzad Mohandespour
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