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Volume 1 / 1990 - Volume 27 / 2011
111
Editorial
Vishwani D. Agrawal
113-114
Test Technology Technical Council Newsletter
B. Kim
115-126
Error Diagnosis of Sequential Circuits Using Region-Based Model
Anand L. D’Souza and Michael S. Hsiao
127-134
An Analog Circuit Fault Characterization Methodology
Yvan Maidon, Thomas Zimmer and André Ivanov
135-146
Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks
Tiago R. Balen, Antonio Q. Andrade, Florence AzaÏs, Marcelo Lubaszewski and Michel Renovell
147-159
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current
Swarup Bhunia, Arijit Raychowdhury and Kaushik Roy
161-168
Phase Shifter Merging
Dimitri Kagaris
169-179
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test
Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard and Serge Pravossoudovitch, et al.
181-195
Selection of Crosstalk-Induced Faults in Enhanced Delay Test
Huawei Li and Xiaowei Li
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