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Volume 1 / 1990 - Volume 27 / 2011
215
Editorial
217-218
Test Technology Newsletter June 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim
219-228
A Low-Cost Jitter Measurement Technique for BIST Applications
Jiun-Lang Huang, Jui-Jer Huang and Yuan-Shuang Liu
229-237
A Novel RF Test Scheme Based on a DFT Method
Jee-Youl Ryu, Bruce C. Kim and Iboun Sylla
239-253
An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults
Jack Smith, Tian Xia and Charles Stroud
255-272
Defect Simulation Methodology for iDDT Testing
Abhishek Singh, Jim Plusquellic, Dhananjay Phatak and Chintan Patel
273-285
Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification
Tao Lv, Jian-Ping Fan, Xiao-Wei Li and Ling-Yi Liu
287-296
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel and Simone Borri, et al.
297-299
Combining Scan Test and Built-in Self Test
Markus Seuring
301-303
Security Extension for IEEE Std 1149.1
Franc Novak and Anton Biasizzo
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