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Volume 1 / 1990 - Volume 27 / 2011
111
Editorial
Vishwani D. Agrawal
113-114
Test Technology Newsletter April 2007 The Newsletter of the Test Technology Technical Council of the IEEE Computer Society
Bruce Kim
115-116
Guest Editorial
Mohammad Tehranipoor
117-129
Defect-tolerant Logic with Nanoscale Crossbar Circuits
Tad Hogg and Greg Snider
131-144
A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology
Jason G. Brown and R. D. Blanton
145-161
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
Zhanglei Wang and Krishnendu Chakrabarty
163-174
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire
Jing Huang, Mariam Momenzadeh and Fabrizio Lombardi
175-192
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems
Jia Di and Parag K. Lala
193-210
QCA Circuits for Robust Coplanar Crossing
Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi and Salvatore Pontarelli
211-218
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata
Mo Liu and Craig S. Lent
219-233
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Fei Su, William Hwang, Arindam Mukherjee and Krishnendu Chakrabarty
235-254
Towards Nanoelectronics Processor Architectures
Wenjing Rao, Alex Orailoglu and Ramesh Karri
255-266
Designing Nanoscale Logic Circuits Based on Markov Random Fields
K. Nepal, R. I. Bahar, J. Mundy, W. R. Patterson and A. Zaslavsky
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