Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
321
Editorial
Vishwani D. Agrawal
323-324
Test Technology Newsletter August 2008
325-326
Guest Editorial
Nicola Nicolici and Patrick Girard
327-334
Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells
Xijiang Lin and Yu Huang
335-351
Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations
Ozgur Sinanoglu
353-364
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction
N. Badereddine, Z. Wang, P. Girard, K. Chakrabarty and A. Virazel, et al.
365-378
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment
Hong-Sik Kim, Sungho Kang and Michael S. Hsiao
379-391
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing
Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara and Laung-Terng Wang, et al.
393-403
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy
Ho Fai Ko and Nicola Nicolici
405-420
On Composite Leakage Current Maximization
Ashesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal and Sandip Kundu