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Volume 1 / 1990 - Volume 27 / 2011
421
Editorial
Vishwani D. Agrawal
423-424
Test Technology Newsletter October 2008 The Newsletter of the Test Technology Technical Council of the IEEE Computer Society
425-437
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors
Egas Henes Neto, Gilson Wirth and Fernanda Lima Kastensmidt
439-448
Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells
Ozgur Sinanoglu
449-460
Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain Amplifier
Xinsong Zhang, Simon S. Ang and Chandra Carter
461-472
Noise-Insensitive Digital BIST for any PLL or DLL
Stephen Sunter and Aubin Roy
473-479
Reverse Breakdown Voltage Measurement for Power P+NN+ Rectifier
Guangyu Huang and Cher Ming Tan
481-496
Controllability of Static CMOS Circuits for Timing Characterization
Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham and Manuel d’Abreu
497-504
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling
Erik Larsson and Zebo Peng
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