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Volume 1 / 1990 - Volume 27 / 2011
505-506
Editorial
Vishwani D. Agrawal
507-508
Test Technology Newsletter
509-527
Self-Testing Embedded Borden t-UED Code Checkers for t = 2kq − 1 with q = 2m − 1
Steffen Tarnick
529-538
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines
Roberto Gómez, Alejandro Girón and Victor H. Champac
539-553
An Automotive CD-Player Electro-Mechanics Fault Simulation Using VHDL-AMS
Mariagrazia Graziano and Massimo Ruo Roch
555-566
Online Testing of MEMS Based on Encoded Stimulus Superposition
N. Dumas, Z. Xu, K. Georgopoulos, R. J. T. Bunyan and A. Richardson
567-576
Linearity Testing of A/D Converters Using Selective Code Measurement
Shalabh Goyal and Abhijit Chatterjee
577-590
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury and Kaushik Roy
591-595
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR
Myung-Hoon Yang, Yongjoon Kim, Sunghoon Chun and Sungho Kang
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