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Volume 1 / 1990 - Volume 27 / 2011
127-144
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash
O. Ginez, J.-M. Daga, P. Girard, C. Landrault and S. Pravossoudovitch, et al.
145-156
A Built-in-Self-Test Σ-Δ ADC Prototype
Hao-Chiao Hong, Sheng-Chuan Liang and Hong-Chin Song
157-168
Test Points Selection for Analog Fault Dictionary Techniques
Chenglin Yang, Shulin Tian and Bing Long
169-185
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals
Reza M. Rad and Jim Plusquellic
187-195
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test
A. Quiros-Olozabal and M. A. Cifredo-Chacon
197-207
Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion
Mihir R. Choudhury, Quming Zhou and Kartik Mohanram
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