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Volume 1 / 1990 - Volume 27 / 2011
209
Editorial
Vishwani D. Agrawal
211-212
Test Technology Newsletter
213-223
Critical Path Selection for Delay Testing Considering Coupling Noise
Rajeshwary Tayade and Jacob A. Abraham
225-245
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard
Mehran Mozaffari-Kermani and Arash Reyhani-Masoleh
247-258
X-tolerant Test Data Compaction with Accelerated Shift Registers
Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger and Michael Gössel
259-268
Adaptive Debug and Diagnosis Without Fault Dictionaries
Stefan Holst and Hans-Joachim Wunderlich
269-278
A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard
G. Di Natale, M. Doulcier, M. L. Flottes and B. Rouzeyre
279-283
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range
R. Fernández
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