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Volume 1 / 1990 - Volume 27 / 2011
401
Editorial
Vishwani D. Agrawal
403-404
Test Technology Newsletter
405-417
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices
Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal and Pramod Variyam
419-428
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm
Ting Long, Houjun Wang, Shulin Tian, Jianguo Huang and Bing Long
429-441
A BIST Solution for Frequency Domain Characterization of Analog Circuits
Manuel J. Barragán, Diego Vázquez and Adoración Rueda
443-451
A New Built-in TPG Based on Berlekamp–Massey Algorithm
Cleonilson Protásio de Souza, Francisco Marcos de Assis and Raimundo Carlos Silvério Freire
453-464
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism
Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev and Kees Goossens
465-481
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power
Sobeeh Almukhaizim, Shouq Alsubaihi and Ozgur Sinanoglu
483-493
On the Duality of Probing and Fault Attacks
Berndt M. Gammel and Stefan Mangard
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