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Volume 1 / 1990 - Volume 27 / 2011
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Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits
Erik Jan Marinissen and Yervant Zorian
Online First™, 3 February 2012
Test Technology Newsletter
Online First™, 1 February 2012
New Editors, 2012
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories
P.-D. Mauroux, A. Virazel, A. Bosio, L. Dilillo and P. Girard, et al.
Online First™, 31 January 2012
2011 JETTA Reviewers
Challenges for Semiconductor Test Engineering: A Review Paper
Stefan R. Vock, Omar J. Escalona, Colin Turner and Frank J. Owens
Online First™, 25 January 2012
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features
Bing Long, Shulin Tian and Houjun Wang
Online First™, 24 January 2012
A Modified Simulation-Based Multi-Signal Modeling for Electronic System
Chen Xiaomei, Meng Xiaofeng and Wang Guohua
Online First™, 17 January 2012
Iterative Antirandom Testing
Ireneusz Mrozek and Vyacheslav N. Yarmolik
Online First™, 10 January 2012
A New Optimal Test Node Selection Method for Analog Circuit
Hui Luo, Youren Wang, Hua Lin and Yuanyuan Jiang
Online First™, 2 January 2012
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