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Volume 1 / 1990 - Volume 26 / 2010
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Efficient Concurrent Self-Test with Partially Specified Patterns
Michael A. Kochte, Christian G. Zoellin and Hans-Joachim Wunderlich
Online First™, 26 August 2010
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes
Zhen Wang, Mark Karpovsky and Konrad J. Kulikowski
Online First™, 11 August 2010
Classification of Activated Faults in the FlexRay-Based Networks
Yasser Sedaghat and Seyed Ghassem Miremadi
Online First™, 19 July 2010
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