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Journal
Journal of Electronic Testing
Publisher
Springer Netherlands
ISSN
0923-8174 (Print) 1573-0727 (Online)
Subject Collection
Engineering
Subject
Computer Science
,
Engineering
,
Circuits and Systems
,
Electronic and Computer Engineering
and
Computer-Aided Engineering (CAD, CAE) and Design
SpringerLink Date
Friday, April 05, 2002
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Editorial Board
About This Journal
Manuscript Submission
Editorial View
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26 Volumes
First
|
Current -20
|
19-14
|
13-8
|
7-2
|
1
|
Next
Online First™ (14)
Volume 26
Number 1 / February, 2010
Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi
1-144
Volume 25
Number 6 / December, 2009
285-352
Numbers 4-5 / August, 2009
209-283
Numbers 2-3 / June, 2009
127-207
Number 1 / February, 2009
Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim
1-126
Volume 24
Number 6 / December, 2008
505-595
Number 5 / October, 2008
421-504
Number 4 / August, 2008
Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
321-420
Numbers 1-3 / June, 2008
Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi
1-320
Volume 23
Number 6 / December, 2007
SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING
465-633
Number 5 / October, 2007
369-464
Number 4 / August, 2007
271-368
Numbers 2-3 / June, 2007
111-266
Number 1 / February, 2007
5-106
Volume 22
Numbers 4-6 / December, 2006
307-482
Number 3 / June, 2006
215-303
Number 2 / April, 2006
111-210
Number 1 / February, 2006
5-107
Volume 21
Number 6 / December, 2005
567-658
Number 5 / October, 2005
459-561
Number 4 / August, 2005
Special Issue on On-Line-Testing and Fault Tolerance
Guest Editors
Ceceilia Metra and Régis Leveugle
343-455
Number 3 / June, 2005
199-339
Number 2 / April, 2005
111-195
Number 1 / February, 2005
5-107
Volume 20
Number 6 / December, 2004
571-681
Number 5 / October, 2004
On-line Testing
Guest Editors
Cecilia Metra and Matteo Reorda
459-567
Number 4 / August, 2004
Special Issue on the Third IEEE Latin-American Test Workshop
327-454
Number 3 / June, 2004
219-323
Number 2 / April, 2004
127-216
Number 1 / February, 2004
5-122
26 Volumes
First
|
Current -20
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19-14
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13-8
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7-2
|
1
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Author
Vishwani D. Agrawal
M. Renovell
Bernd Becker
Luigi Carro
A. Ivanov
Fabrizio Lombardi
André Ivanov
J. Figueras
Yervant Zorian
P. Girard
Article Category
Editorial Board (23)
Editorial Introduction (15)
Jetta Letters (5)
Call for Papers (5)
Test Generation (4)
Jetta Letter (4)
JETTA Letters (4)
Structure-Based Algorithms (4)
Self-test and Self-checking Circuits (3)
Design and Synthesis for Testability (3)
Self-test Systems (3)
Call for papers (3)
Fault-tolerant and Testable Design (2)
Design for Testability (2)
Memory Test (2)
Fault Diagnosis (2)
Built-In Self-Test (2)
High-Level Design (2)
Testability Analysis Based Algorithms (2)
Delay Test (2)
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