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Journal of Electronic Testing

Journal of Electronic Testing

PublisherSpringer Netherlands
ISSN0923-8174 (Print) 1573-0727 (Online)
Subject CollectionEngineering
SubjectComputer Science, Engineering, Circuits and Systems, Electronic and Computer Engineering and Computer-Aided Engineering (CAD, CAE) and Design
SpringerLink DateFriday, April 05, 2002
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26 VolumesFirst | Current -20 | 19-14 | 13-8 | 7-2 | 1 | Next
Online First™ (14)
Volume 26
 
Number 1 / February, 2010
Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi
 1-144
Volume 25
 
Number 6 / December, 2009
 285-352
 
Numbers 4-5 / August, 2009
 209-283
 
Numbers 2-3 / June, 2009
 127-207
 
Number 1 / February, 2009
Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim
 1-126
Volume 24
 
Number 6 / December, 2008
 505-595
 
Number 5 / October, 2008
 421-504
 
Number 4 / August, 2008
Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
 321-420
 
Numbers 1-3 / June, 2008
Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi
 1-320
Volume 23
 
Number 6 / December, 2007
SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING
 465-633
 
Number 5 / October, 2007
 369-464
 
Number 4 / August, 2007
 271-368
 
Numbers 2-3 / June, 2007
 111-266
 
Number 1 / February, 2007
 5-106
Volume 22
 
Numbers 4-6 / December, 2006
 307-482
 
Number 3 / June, 2006
 215-303
 
Number 2 / April, 2006
 111-210
 
Number 1 / February, 2006
 5-107
Volume 21
 
Number 6 / December, 2005
 567-658
 
Number 5 / October, 2005
 459-561
 
Number 4 / August, 2005
Special Issue on On-Line-Testing and Fault Tolerance
Guest EditorsCeceilia Metra and Régis Leveugle
 343-455
 
Number 3 / June, 2005
 199-339
 
Number 2 / April, 2005
 111-195
 
Number 1 / February, 2005
 5-107
Volume 20
 
Number 6 / December, 2004
 571-681
 
Number 5 / October, 2004
On-line Testing
Guest EditorsCecilia Metra and Matteo Reorda
 459-567
 
Number 4 / August, 2004
Special Issue on the Third IEEE Latin-American Test Workshop
 327-454
 
Number 3 / June, 2004
 219-323
 
Number 2 / April, 2004
 127-216
 
Number 1 / February, 2004
 5-122
26 VolumesFirst | Current -20 | 19-14 | 13-8 | 7-2 | 1 | Next
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