- Online First™
On the Use of Static Temperature Measurements as Process Variation Observable
Didac Gómez, Josep Altet and Diego Mateo
Online First™, 16 May 2012
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Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform
Shao-Feng Hung and Hao-Chiao Hong
Online First™, 9 May 2012
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Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM
Bing Long, Shulin Tian and Houjun Wang
Online First™, 7 May 2012
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Test Technology Newsletter
Online First™, 3 May 2012
- Online First™
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits
Judit F. Freijedo, Jorge Semião, Juan J. Rodriguez-Andina, Fabian Vargas and Isabel C. Teixeira, et al.
Online First™, 1 May 2012
- Online First™
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard and Serge Pravossoudovitch, et al.
Online First™, 18 April 2012
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Robust Coupling Delay Test Sets
Joonhwan Yi and John P. Hayes
Online First™, 13 April 2012
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IC Immunity Modeling Process Validation Using On-Chip Measurements
S. Ben Dhia, A. Boyer, B. Vrignon and M. Deobarro
Online First™, 5 April 2012
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Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator
Kazuyuki Wakabayashi, Keisuke Kato, Takafumi Yamada, Osamu Kobayashi and Haruo Kobayashi, et al.
Online First™, 31 March 2012
- Online First™Open Access
High Speed On-Chip Signal Generation for Debug and Diagnosis
Tsung-Yen Tsai, Sadok Aouini and Gordon Walter Roberts
Online First™, 31 March 2012