The crystal structure of the synthetic Ge-modification of the mineral natisite, Na₂{ TiOGeO₄}, has been refined by X-ray diffraction method (a four-circle diffractometer, 2θ/θ scanning, MoK _α-radiation, θ_max = 50°: a = 6.658(1), c = 5.161(1) Å, sp. gr. _P4/_nmm, Z = 2, ρ_calcd = 3.58 g/cm³, _R1 = 0.030, s = 1.131, wR(_F ²) = 0.058 (352 reflections with I≥2σI). The comparative crystallochemical analysis of the related (including hypothetical) phases with the anionic {MTO ₅} radicals (M = Ti, V, Ge; T = Ge, Si, P) is performed with the aim of revealing a possible relationship between the composition and the structure type of the compounds.