We prove lower bounds on the complexity of maintaining fully dynamic
k -edge or
k -vertex connectivity in plane graphs and in
(k-1) -vertex connected graphs. We show an amortized lower bound of
(log n / {k (log log n} + log b)) per edge insertion, deletion, or query operation in the cell probe model, where
b is the word size of the machine and
n is the number of vertices in
G . We also show an amortized lower bound of
(log n /(log log n + log b)) per operation for fully dynamic planarity testing in embedded graphs. These are the first lower bounds for fully dynamic
connectivity problems.
Key words. Dynamic planarity testing, Dynamic connectivity testing, Lower bounds, Cell probe model.
Received January 1995; revised February 1997.