Volume 15, Number 2, 63-75, DOI: 10.1007/s00138-002-0074-1

Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators

Tong Fang, MohsenA. Jafari, StephenC. Danforth and Ahmad Safari

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Abstract

This paper presents the concept of a process signature for the use of online signature analysis and defect detection in the layered manufacturing (LM) of ceramic sensors and actuators. To achieve the high quality of parts built by the fused deposition of ceramics (FDC), an online process-monitoring system is implemented to detect the processing defects. Using a process signature extracted from the image of a layer captured by the monitoring system, an ideal image is created that is then compared to the original image to detect and identify the defects. Some results of signature analysis and defect detection for single-material and multi-material parts are also presented.

Keywords:  Signature analysis - Defect detection - Layered manufacturing - Inspection system - Fused deposition of ceramics

Received: 22 July 1999, Accepted: 21 October 2001, Published online: 29 October 2003
Correspondence to: Mohsen A. Jafari
This work was supported by the Office of Naval Research under grant # N-0014-96-1-1175. Ref. US Patent # S-5738817, April 14, 1998.

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