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Universal Steganalysis Using Multiwavelet Higher-Order Statistics and Support Vector Machines
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Universal Steganalysis Using Multiwavelet Higher-Order Statistics and Support Vector Machines
San-ping Li1 , Yu-sen Zhang1, Chun-hua Li2 and Feng Zhao1
| (1) |
Institute of Command Automation, PLA University of Sci. and Tech, Nanjing 210007, China |
| (2) |
College of Computer Sci. and Tech., Huazhong University of Sci. and Tech., Wuhan, 430074, China |
Abstract
In this paper, a new universal steganalysis algorithm based on multiwavelet higher-order statistics and Support Vector Machines(SVM)
is proposed. We follow the philosophy introduced in Ref[7] in which the features are calculated from the stego image’s noise
component in the wavelet domain. Instead of working in wavelet domain, we calculate the features in multiwavelet domain. We
call this Multiwavelet Higher-Order Statistics (MHOS) feature. A nonlinear SVM classifier is then trained on a database of
images to construct a universal steganalyzer. The comparison to the current state-of-the-art universal steganalyzers, which
was performed on the same image databases under the same testing conditions, indicates that the proposed universal steganalysis
offers improved performance.
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