Evolving Variability-Tolerant CMOS Designs
James Alfred Walker4
, James A. Hilder4
and Andy M. Tyrrell4 
| (4) |
Intelligent Systems Group, Department of Electronics, University of York, Heslington, York, YO10 5DD, UK |
Abstract
As the size of CMOS devices is approaching the atomic level, the increasing intrinsic device variability is leading to higher
failure rates in conventional CMOS designs. In this paper, two approaches are proposed for evolving unconventional variability-tolerent
CMOS designs: one uses a simple Genetic Algorithm, whilst the other uses Cartesian Genetic Programming. Both approaches successfully
evolve unconventional designs for logic gates, whilst an inverter design also shows signs of variability-tolerance.
The authors would like to thank all partners of the nano-CMOS project, especially the DMG at the University of Glasgow for
their Randomspice program.
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