This paper proposes a two stage AAM fitting algorithm that is robust to the cluttered background and a large motion. The proposed
AAM fitting algorithm consists of two alternative procedures: the active contour fitting to find the contour sample that best
fits the face image and then the active appearance model fitting over the best selected contour. Experimental results show
that the proposed active contour based AAM provides better accuracy and convergence characteristics in terms of RMS error
and convergence rate, respectively, than the existing robust AAM.
This work was supported by the Korea Science and Engineering Foundation (KOSEF) through the Biometrics Engineering Research
Center (BERC) at Yonsei University.