A range of percolating atomic cluster films, with
nanoscale overall dimensions, have been studied using a
combination of
in situ and
ex situ electrical transport
measurements, together with field emission electron microscopy
and atomic force microscopy. Bismuth clusters with mean diameter
20 nm were deposited between electrical contacts defined by
electron beam lithography. The morphology of the films can be
understood within percolation theory, and the electrical
measurements show complex behaviour characteristic of both
percolation effects and modification of the cluster films by
current flow and by oxidation.
PACS. 73.63.-b Electronic transport in nanoscale
materials and structures - 36.40.-c Atomic and molecular
clusters - 64.60.Ak Renormalization-group, fractal, and
percolation studies of phase transitions 81.07.-b Nanoscale
materials and structures: fabrication and
characterization