A laboratory method for manufacturing position-sensitive optical detectors based on thin films of the CdTe-type semiconductors is described. These detectors are capable of generating anomalously high photoelectric voltages. To render a detector position-sensitive, the film thickness is increased stepwise, starting at ∼1 µm (for CdTe films).
__________Translated from Pribory i Tekhnika Eksperimenta, No. 4, 2005, pp. 125–126.
Original Russian Text Copyright © 2005 by Rakhimov, Ser’eznov.