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Software Product Lines
10.1007/978-3-540-33253-4_6
Timo Käköla and Juan Carlos Duenas
6. Consolidated Product Line Variability Modeling

Joachim BayerContact Information, Sebastien GerardContact Information, Øystein HaugenContact Information, Jason MansellContact Information, Birger Møller-Pedersen7, Jon OldevikContact Information, Patrick TessierContact Information, Jean-Philippe Thibault10 and Tanya Widen11 Contact Information

(3)  Fraunhofer IESE, Fraunhofer Platz 1, 67663, Kaiserslautern, Germany
(4)  CEA-List / L-LSP Saclay, 91191, Gif-sur-Yvette Cedex, France
(5)  Department of Informatics, University of Oslo, 1080, N-0316 Blindern, Oslo, Norway
(6)  European Software Institute (ESI), Parque Tecnológico de Bizkaia #204, E-48170 Zamudio, Bizkaia, Spain
(7)  Department of Informatics, University of Oslo, 1080, N-0316 Blindern, Oslo, Norway
(8)  SINTEF ICT, 124, N-0314 Blindern, Oslo, Norway
(9)  CEA-List / L-LSP Saclay, 91191, Gif-sur-Yvette Cedex, France
(10)  IRISA & Institut National de Recherche en Informatique et Automatique (INRIA), Campus de Beaulieu, F-35042, Rennes Cedex, France
(11)  Nokia Research Center, NOKIA GROUP, 407, FIN-00045, Finland

Without Abstract

Contact Information Joachim Bayer
Email: bayer@iese.fhg.de

Contact Information Sebastien Gerard
Email: sebastien.gerard@cea.fr

Contact Information Øystein Haugen
Email: oysteinh@ifi.uio.no

Contact Information Jason Mansell
Email: jason.mansell@esi.es

Contact Information Jon Oldevik
Email: jon.oldevik@sintef.no

Contact Information Patrick Tessier
Email: patrick.tessier@cea.fr

Contact Information Tanya Widen
Email: tanya.widen@nokia.com
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