X-ray diffraction (XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is
briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite-containing pottery
sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite
content of such samples could be determined.
X-ray diffraction - Rietveld simulation - graphite - graphite clays - black pottery
This revised version was published online in July 2006 with corrections to the Cover Date.