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Book Chapter
IEEE 1149.4: Analog Boundary-Scan
Kenneth P. Parker
2003, The Boundary — Scan Handbook, Pages 225-266
IEEE 1149.4 Analog Boundary-Scan
2002, The Boundary-Scan Handbook, Pages 221-262
Boundary Scan
Frontiers in Electronic Testing, 1, Volume 29, Introduction to Advanced System-on-Chip Test Design and Optimization, Part 1, Pages 53-64
Design for Testability and Built-In Self-Test
Frontiers in Electronic Testing, 1, Volume 30, Fault Diagnosis of Analog Integrated Circuits, Pages 133-151
Mixed-Signal Testing and DfT
Stephen Sunter
Frontiers in Electronic Testing, 1, Volume 27, Gizopoulos / Advances in ElectronicTesting, Pages 301-336
Journal Article
Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture
Jari Hannu, Teuvo Saikkonen, Juha Häkkinen, Juha Karttunen and Markku Moilanen
Journal of Electronic Testing, 2010, Volume 26, Number 6, Pages 641-658
Coupling effects in Mixed analog-digital ICs
Willy Sansen
The Kluwer International Series in Engineering and Computer Science, 1, Volume 859, Analog Design Essentials, Pages 743-771
Multi-Step Analog to Digital Converter Testing
Amir Zjajo and José Pineda de Gyvez
Analog Circuits and Signal Processing, 2011, Low-Power High-Resolution Analog to Digital Converters, Pages 103-182
Advanced Boundary-Scan Topics
2003, The Boundary — Scan Handbook, Pages 149-169
Analog Measurement Basics
2003, The Boundary — Scan Handbook, Pages 201-224
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