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Comparing Fault Trees and Bayesian Networks for Dependability Analysis
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Comparing Fault Trees and Bayesian Networks for Dependability Analysis
Andrea Bobbio7, Luigi Portinale7, Michele Minichino8 and Ester Ciancamerla8
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Dipartimento di Scienze e Tecnologie Avanzate, Università del Piemonte Orientale “A. Avogadro”, C.so Borsalino 54, 15100 Alessandria, Italy |
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ENEA - CRE Casaccia, Via Anguillarese 301, 00060 Roma, Italy |
Abstract
Bayesian Networks (BN) provide a robust probabilistic method of reasoning under uncertainty. They have been successfully applied in a variety of
real-world tasks and their suitability for dependability analysis is now considered by several researchers. In the present
paper, we aim at defining a formal comparison between BN and one of the most popular techniques for dependability analysis: Fault Trees (FT). We will show that any FT can be easily mapped into a BN and that basic inference techniques on the latter may be used to obtain classical parameters computed using the former (i.e.
reliability of the Top Event or of any sub-system, criticality of components, etc...). Moreover, we will discuss how, by using
BN, some additional power can be obtained, both at the modeling and at the analysis level. In particular, dependency among components
and noisy gates can be easily accommodated in the BN framework, together with the possibility of performing general diagnostic analysis. The comparison of the two methodologies
is carried on through the analysis of an example that consists of a redundant multiprocessor system, with local and shared
memories, local mirrored disks and a single bus.
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