The atomic force microscope (AFM) may be used to collect quantitative height data from extracellular matrix molecules and macro-molecular assemblies adsorbed to a wide range of solid substrates. The advantages of atomic force microscopy include rapid specimen preparation, which does not rely on chemical fixation, dehydration or heavy-metal staining, and sub-nanometre resolution imaging with a high signal–noise ratio. In combination with complimentary techniques such as molecular combing and by exploiting the ability to act as a force spectrometer, the AFM can provide valuable information on the nano-mechanical properties of extracellular matrix components.