Highly textured single-oriented (110)

Nd-doped potassium gadolinium tungstate [Nd:KGd(WO
4)
2 or Nd:KGW] thin films were successfully fabricated on (100)

Si substrate by introducing a (100)

CeO
2 buffer layer using KrF-excimer-laser pulsed laser deposition (PLD) at precisely controlled experimental conditions. The CeO
2 buffer layer was also prepared by PLD. Home-made potassium-enriched ceramic targets were prepared and used in order to prevent K deficiency in the film during the deposition. Depositions were performed in both Ar and O
2 environments. The optimal growing conditions achieved from the viewpoint of best crystallinity, optical properties and surface morphology were: d
T–S=4 cm, P(O
2)=0.08 mbar and T
sub=700 °C, respectively. Improvement of the properties of the as-grown films was examined by post-deposition annealing between 700 °C and 900 °C in air. Optical waveguide loss and the photoluminescence spectrum in the 800–1400-nm range were measured.
PACS 81.15.Fg; 42.79.Gn; 42.79.Hj