Hideo Tamamoto received the B.E. degree in electronic engineering, the M.E. and D.E. degrees in electrical engineering from the University of Tokyo, in 1971, 1973 and 1976, respectively. In 1976, he joined the faculty of Akita University. Since 1993 he has been a professor in the Department of Computer Science and Engineering, Faculty of Engineering and Resource Science, Akita University, Japan. From 1996 to 1997, he was a visiting professor at the Electronic Engineering Department, Polytechnical University of Catalonia, Spain and at the Department of Electrical Engineering, the University of Iowa, U.S.A. His current research interests are testable design of logic circuits and current/thermal testing of CMOS logic circuits. He is a member of IPS, JSAI, SICE and IEEE.

Kewal K. Saluja obtained his B.E. degree in electrical engineering from the University of Roorkee, India in 1967, M.S. and Ph.D. degrees in electrical and computer engineering from the University of Iowa, Iowa City in 1972 and 1973 respectively. He is currently with the Department of Electrical and Computer Engineering at the University of Wisconsin-Madison as a Professor, where he teaches courses in logic design, computer architecture, microprocessor based systems, VLSI design and testing, and fault-tolerant computing. Prior to this he was at the University of Newcastle, Australia. Professor Saluja has held visiting and consulting positions at various national and international institutions including University of Southern California, Hiroshima University, Nara Institute of Science and Technology, and the University of Roorkee. He has also served as a consultant to the United Nations Development Program. He served as an Editor of the IEEE Transactions on Computers (1997--2001), and he is an associate editor for the letters section of the Journal of Electronic Testing: Theory and Applications (JETTA) published by Kluwer. Professor Saluja is a fellow of JSPS and a fellow of IEEE.

Kozo Kinoshita received B.E., M.E., and Ph.D. degrees in communication engineering from Osaka University in 1959, 1961, and 1964, respectively. From 1964 to 1966 he was an assistant professor and from 1967 to 1977, an associate professor of electronic engineering at Osaka University, Japan. From 1978 to 1989, he was a professor in the Department of Information and Behavioral Sciences, Hiroshima University, Japan. From 1989 to 2000, he again joined Osaka University as a professor in the Department of Applied Physics, and was a professor of Osaka University. Since April 2000, he has been a professor at Faculty of Informatics, Osaka Gakuin University, and is the Dean of Informatics. His fields of interest are test generation, fault diagnosis, memory testing, current testing, crosstalk testing, compact testing and testable design for logic circuits. He organized a series of Asian Test Symposium and was the Group Chair of Asian and Pacific Activities in Test Technology Technical Council of IEEE Computer Society until 2002. Prof. Kinoshita is IEEE Life Fellow and a member of the Institute of Information Processing of Japan. He was a member of the editorial board of JETTA until 2000.