Curved Kikuchi lines have been observed in electron diffraction patterns obtained for silicon by transmission electron microscopy.
It is found that the curvature of Kikuchi lines is related to the shift of point reflections from their normal positions.
The formation of curved Kikuchi lines stems from the local structural defects in the crystals under study.
PACS numbers 61.14.-x
Original Russian Text © R.K. Karakhanyan, K.R. Karakhanyan, 2007, published in Kristallografiya, 2007, Vol. 52, No. 5, pp.
798–799.